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About the Conference

Our conference is where scientists and innovators meet to share, inspire and network. We’re proud to host the

Joint TC1 - TC2 International Symposium on Photonics and Education in Measurement Science 2019

in collaboration with the Conference on Optical Fibre & Photonic Sensors for Industrial & Safety Applications (OFSIS).

This year’s schedule is more packed than ever before with scientific keynotes and lectures about new technologies, methods and applications as well as scientific tours and exhibition of instruments and solutions for photonic measurement sciences.

 

Speakers & Participants

We are very much looking forward to meet and collaborate with the participants of this year's conference! This is a unique opportunity to learn from scientists and industry experts in photonics and machine vision.


Take this opportunity and let yourself be inspired by talented people and secure your seat!

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 Program of the Conference

Day 1 – 17.09.2019

09:00 Uhr

09:00-09:30    Registration
09:30-10:00    Welcome Address from the Organizers

(Dr. Maik Rosenberger, Prof. Dr. Bernhard Zagar, Paul-Gerald Dittrich)
10:00-11:30    Session 1
6 Presentations 12 min + 3 min Q&A
11:30-13:15    Lunch (in parallel Industrial Exhibition)
13:15-14:00    Keynote 1

5D Imaging: Multispectral and multimodal 3D sensor technologies;

Prof. Dr. Gunther Notni; 35 min + 10 min Q&A
14:00-15:30    Session 2
6 Presentations 12 min + 3 min Q&A
15:30-16:00    Coffee Break (in parallel Industrial Exhibition)
16:00-17:30    Session 3
6 Presentations 12 min + 3 min Q&A
17:30-18:30   Postersession 1 & Guided Industrial Exhibition
--> Transfer to the Evening Event
19:30-22:00    Evening Event - Zeiss-Planetarium
--> Get Together with Snacks & Drinks

Link: www.planetarium-jena.de

Day 2 – 18.09.2019

09:00 Uhr

09:00-09:30    Registration
09:30-11:30    Scientific Tour

Fraunhofer Institute for Applied Optics and Precision Engineering IOF
Albert-Einstein-Str. 7, 07745 Jena

Link: www.iof.fraunhofer.de
11:30-13:15    Lunch (in parallel Industrial Exhibition)
13:15-14:00    Keynote 2

Photonics meets Image Processing: EMVA's standards 1288 for camera characterization and the new Open Optics Camera Interface Standard OOCI;

Prof. Dr. Bernd Jähne; 35 min + 10 min Q&A
14:00-15:30    Session 4
6 Presentations 12 min + 3 min Q&A
15:30-16:00    Coffee Break (in parallel Industrial Exhibition)
16:00-17:30    Session 5
6 Presentations 12 min + 3 min Q&A
17:30-18:30    Postersession 2 & Guided Industrial Exhibition
--> Transfer to the Evening Event
19:30-22:00    Evening Event – Thuringia Barbecue

--> Get Together with Snacks & Drinks

Link: www.zurnoll.de

Day 3 – 19.09.2019

09:30 Uhr

09:30-10:00    Registration
10:00-11:30    Session 6

6 Presentations 12 min + 3 min Q&A
11:30-13:15    Lunch (in parallel Industrial Exhibition)
13:15-14:45    Session 7
4 Presentations 12 min + 3 min Q&A


Joint TC1 and TC2 Committee Meeting

>> Collaborative thinking about photonics and education in measurement science <<


14:45-15:30    Closing Ceremony

 

Call for Papers

The joint symposium will be focused on the theme “Photonics and Education in Measurement Science” and will provide a forum for the exchange of the latest research findings and innovations related to this theme. Original contributions relating to this theme are welcomed.

Here you find all necessary information concerning "Paper Publication", "Conference Timeline", "Scientific Topics", "Submission of Paper", "Conference Fee" and "Further Information" concerning your participation.

 

Paper Publication

All accepted and presented papers at the conference are planned to be published in the SPIE Digital Library. In addition, it is planned that chosen authors can extend and modify their papers and that these papers could then be considered for publication in a SPIE Journal.

Submission of Paper

After submitted ABSTRACTS are peer reviewed with possitive feedback the Authors are invited to submit papers of min. 4 pages (max. 10 pages) according to the guidelines and information of SPIE – The international society for optics and photonics.

Each paper will go through peer review by at least two subject experts.


Templates and guidelines:

http://spie.org/manuscripts

​​

SPIE online submission:

http://spie.org/submissions/submit

Further information for paper submission can be found here.

Timeline

01.10.2018    Open Pre-Registration & ABSTRACT submission
15.02.2019    Submission of technical ABSTRACTS --> Extended until 14.03.2019
29.03.2019    Notification of acceptance
08.04.2019    End of early-bird registration
03.05.2019    Full paper submission --> Extended until 24.05.2019

28.06.2019    Notification of full paper reviews
19.07.2019    Final full paper submission

Scientific Topics

Topics include, but are not limited to, the following:

  • Measurement, Instrumentation and Photonics for Education & Training

  • Applied Photonics for Science and Engineering in Industry, Biology, Medicine, Environment and Administration

  • Sensor & System Characterization for Machine Vision and Image Processing

  • Photonic Sensors and Systems for Multimodal Sensing

  • Photonics, Machine Vision and Image Processing in UV, VIS, NIR, SWIR and LWIR Wavelength Range including also Thermal and THz

  • Software & Processing of Multivariate and Multidimensional Data as well as Deep Learning Approaches

  • Development of Models, Methods and Algorithms in Photonics, Machine Vision and Image Processing

Further Information

It is a condition of publication that each paper is presented at the conference. Each accepted paper must be registered by an author before the early-bird registration deadline to avoid withdrawal from the conference proceedings and technical program.

Conference Fee

  • 650 EUR Participant Full

  • 550 EUR Participant Full (Early Bird) before 08.04.2019

  • 300 EUR Participant  - Student

  • 150 EUR Accompanying person*


The conference fee includes the scientific and social program, food and beverages, the certificate of attendance as well as a print version of the conference proceedings.

* Accompanying person can attend the social program

Registration Joint TC1 - TC2 International Symposium
17. Sept. 2019, 10:00 – 19. Sept. 2019, 16:00
Technologie- und Innovationspark Jena,
Hans-Knöll-Straße 6, 07745 Jena, Germany
 

The Highlights

 
Conference

Scientific Keynotes

5D Imaging: Multispectral and multimodal 3D sensor technologies


Prof. Dr. Gunther Notni


Photonics meets Image Processing: EMVA's standards 1288 for camera characterization and the new Open Optics Camera Interface Standard OOCI


Prof. Dr. Bernd Jähne

Audience and Lecturer

Lectures & Posters

more than 40 oral lectures in 6 sessions and 2 poster sessions are planned

Party

Conference Dinner

with collaborative networking and “Thuringian Barbecue”

Link: www.zurnoll.de

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Exclusive Tour

to the Fraunhofer Institute for Applied Optics and Precision Engineering IOF

Link: www.iof.fraunhofer.de

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Scientific Tour

to the Zeiss-Planetarium Jena

Link: www.planetarium-jena.de

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Exclusive Scientific Exhibition

of Instruments and Solutions for Photonic Measurement Sciences

Special Information on “Intelligent Digital Multichannel Image Processing and Multichannel Image Capturing” (ID2M)

from the research group “Qualimess – next generation”

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in collaboration with the Joint TC1 - TC2 International Symposium

For further information about OFSIS 2019 click here

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Conference Proceedings

The Proceedings of this conference will be published in the SPIE Digital Library with over 470,000 papers from other outstanding conferences and SPIE Journals and books from SPIE Press.

Past Events

 
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IMEKO TC1-TC7-TC13
Joint Symposium 2016

03.08.-05.08.2016
Berkeley, United States

Metrology across the Sciences: Wishful Thinking?

Our Sponsors

 
Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH

Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH

NKT Photonics GmbH

NKT Photonics GmbH

Steinbeis Qualitätssicherung und Bildverarbeitung GmbH (SQB GmbH)

Steinbeis Qualitätssicherung und Bildverarbeitung GmbH (SQB GmbH)

Quantum Design GmbH

Quantum Design GmbH

TechnoTeam Bildverarbeitung GmbH

TechnoTeam Bildverarbeitung GmbH

Vision & Control GmbH

Vision & Control GmbH

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emsys Embedded Systems GmbH

Want to become a sponsor? Get in touch to learn more!

Our Partners

 
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International Measurement Confederation (IMEKO)

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Technologie- und Innovationspark Jena GmbH

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SpectroNet - International Collaboration Cluster

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IMEKO Technical Committee 1 (TC1)

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Johannes Kepler University

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Jena - Town of Light

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IMEKO Technical Committee 2 (TC2)

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Warsaw University of Technology

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Fraunhofer Institute for Applied Optics and Precision Engineering IOF

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Technische Universität Ilmenau

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RWTH Aachen University

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Research group Qualimess

TU Ilmenau Service GmbH

TU Ilmenau Service GmbH

The Organizers

 
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Dr. Maik Rosenberger

Chairman TC1

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Dr. Pawel Mazurek

Co-Chairman TC1

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Paul-Gerald Dittrich

Scientific Secretary TC1

Prof. Dr. Bernhard Zagar

Chairman TC2

Tongyu Liu

Professor Tongyu Liu

OFSIS2019 Organizer

Yanong Ning

Professor Yanong Ning

OFSIS2019 Organizer

Conference Committee

This conference will bring together an impressive array of scientific leaders and influencers to create a one-of-a-kind experience. The steering and international program commitees will be covering a wide range of topics in photonics and education in measurement science.

Steering Committee

Dr. Maik Rosenberger, Technische Universität Ilmenau, Ilmenau, GERMANY
Pawel Mazurek, Warsaw University of Technology, Warsaw, POLAND
Paul-Gerald Dittrich, SpectroNet International Collaboration Cluster, Jena, GERMANY
Prof. Bernhard Zagar, Johannes Kepler University, Linz, AUSTRIA
Prof. Robert Schmitt, RWTH Aachen University, Aachen, GERMANY
Jörn Riedel, RWTH Aachen University, Aachen, GERMANY

Prof. Tongyu Liu, Qilu Technology University (Shandong Academy of Science), CHINA

Prof. Yanong Ning, Qilu Technology University (Shandong Academy of Science), CHINA

International Program Committee

Gunther Notni, Germany | Rafael Celestre, Brazil | Jan Holub, Czech Republic | Gerhard Linß, Germany | Miroslav Benisek, Serbia | Peter Kneppo, Slovakia | Roman Morawski, Poland | Karl H. Ruhm, Switzerland | Shigeru Takayama, Japan | Reza Talebi-Daryani, Germany | Leo Van Biesen, Belgium | Eric Benoit, France | Hubert Zangl, Austria | Daniel Garten, Germany | Nataliya Kosach, Ukraine | Jakub Svatos, Czech Republic | Raik Illmann, Germany | Francesco Crenna, Italy | Sanowar H. Khan, Great Britain | Maria Luisa Reis, Brazil | Luca Mari, Italy | Nick Leithold, Germany | Patrick Guillaume, Belgium | Steve Vanlanduit, Belgium | Iakyra Borrakuens Couceiro, Brazil | Armando Albertazzi, Bazil | Jin Shangzhong, China | Xinyong Dong, China | Petr Páta, Czech Republic | Vladimir Vasinek, Czech Republic | Rainer Tutsch, Germany | Tilo Pfeifer, Germany | Simone Carmignato, Italy | Yasuhiro Takaya, Japan | Marcin Gnyba, Poland | Małgorzata Kujawińska, Poland | Carlos A. F. Fernandes, Portugal | Jose Rebordão, Portugal | Seung Kwan Kim, Republic of Korea | Yuri Chugui, Russia | Pedro Corredera, Spain | Kamol Wasapinyokul, Thailand | Akos Zarándy, Hungary | Ken Grattan, UK | Wei Jin, Hongkong | Perry Shum, Singapore | Yunjiang Rao, China | Zuyuan He, China | Saiied Aminossadati, Australia | Edward Lewis, Ireland | Jia Chen, Germany | K. Kalli, Cyprus

 

Get in Touch

We hope you're able to attend. If you have questions about the registration process, our schedule or general information, don’t hesitate to reach out and contact the Conference Organizers.

+49 (0) 175 528 0223

Thanks for submitting!

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Your Visit

We want your experience to be as seamless as possible. If you’ll be joining us from out of town, take a look through a wide range of accommodation and transportation options. We’ve also provided a guide for restaurants and attractions to check out while you’re here. Questions? Simply reach out.